A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...
Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...
Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...
Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...
Researchers at Oak Ridge National Laboratory used specialized tools to study materials at the atomic scale and analyze defects at the materials’ surface. Results of their research help to better ...
In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...
Rajesh Sani, Ph.D., a professor in the Karen M. Swindler Department of Chemical and Biological Engineering and in the Department of Chemistry, Biology and Health Sciences at South Dakota Mines, has ...
Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale investigation, enabling detailed imaging and quantification of surface topography as well as mechanical properties.
AFAM operates by exciting the sample with ultrasonic waves while simultaneously probing the surface with an AFM tip. The ultrasonic waves cause the sample to vibrate, and the AFM tip detects these ...
“We already have a number of Bruker AFMs in our open-access user facilities and are always looking for new technology that can further support the many researchers we serve from both academia and ...
SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today that its next-generation Atomic Force Microscope (AFM), Vero, has received three prestigious awards. Vero AFM ...
AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...
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