Improving baseline yields and speeding yield learning are always issues in semiconductor manufacturing. Addressing those problems may have just gotten a little easier for defect and yield engineers ...
Such features can make defect tracking fun and less of a boring activity for developers. It will help developers in generating better bug reports, making the entire process of defect management easier ...
However, process- or tool- induced problems may arise during wafer fabrication that cause scratches and other spatial signatures on the wafer that will not be caught by statistical process control ...
MILPITAS, Calif., July 12 /PRNewswire-FirstCall/ — Today KLA-Tencor Corporation® (Nasdaq: KLAC), the world's leading supplier of process control and yield ...
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