Electron microscopy combined with X-ray microanalysis represents a pivotal suite of techniques that have transformed research in materials science, physics and engineering. Utilizing focused beams of ...
AES operates on the principle of the Auger effect, named after the French physicist Pierre Auger. When a material's surface is bombarded with a beam of high-energy electrons or photons, it causes the ...
The copper target was operated at voltages of 11 kV, 12 kV, 13 kV, and 14 kV for the electron source, and a 50 kV configuration using a molybdenum target was used as a representative example for the ...
Strontium titanate is a material of considerable interest for electronic applications. A recent study revealed that strontium titanate (STO) annealed in strontium oxide (SrO) powder exhibits large ...
Among all the instruments in its class, the Thermo Scientific Prisma E Scanning Electron Microscope (SEM) offers the most comprehensive solution, thanks to its sophisticated automation and extensive ...
X-rays, a type of electromagnetic radiation with wavelengths from 0.01 to 10 nanometers, pack enough energy to pierce materials and interact with inner-shell electrons. 1 When they hit a sample, ...
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In this interview, Jonathan Lee, an Application Scientist at Gatan, talks to AZoM about improving sample Analysis using combined cathodoluminescence (CL) and energy dispersive spectroscopy (EDS).
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.
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