Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Dimension XR scanning probe microscope ...
(Nanowerk News) A novel technique under development at the National Institute of Standards and Technology (NIST) uses a relatively inexpensive optical microscope to quickly and cheaply analyze ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback