SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Targeting characterization of communications and high-speed digital devices at the wafer level, the Model S600DC/RF APT (automated parametric test) system from Keithley Instruments (Cleveland, OH, www ...
The reference or demodulated signal can be predetermined and stored as part of the test program. One method using EVM not only makes it possible to increase test coverage via system-level testing, but ...
Keithley Instruments Inc has announced availability of a single-insertion RF and DC parametric test solution for probing wafers of processed communications and high-speed digital devices The S400DC/RF ...
Every day, new methods are being developed to harvest, cleanse, integrate, and analyze data sources and extract from them useful, actionable intelligence to aid decision-making and other processes.
October 22, 2012. Keithley Instruments Inc. has introduced seven instrumentation, software, and test-fixture configurations for parametric curve-tracing applications for characterizing high-power ...
To improve yield, quality, and cost, two separate test parameters can be combined to determine if a part passes or fails. The results gleaned from that approach are more accurate, allowing test and ...
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