GEN

Principle of Scanning Probe Microscopy

A theme of this month’s column is education. Most of the sites I’ve covered this month have a strong educational component and Principle of Scanning Probe Microscopy is no exception. With content ...
Nanowerk

Kelvin Probe Force Microscopy Explained: Nanoscale Surface Analysis

Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...
AZoNano

Conversations on AFM: How AI is Automating Scanning Probe Microscopy

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...
AZOM

An Introduction to Reverse Tip Sample Scanning Probe Microscopy (RTS SPM)

The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...
Nanowerk

Understanding Scanning Near-field Optical Microscopy in Nanotechnology

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...