AUSTIN, Texas--(BUSINESS WIRE)-- NI (NASDAQ: NATI) today announced the acquisition of SET GmbH (“SET”), long-standing experts in aerospace and defense test system development and recent innovators in ...

Heterogeneous integration is driving innovation in the semiconductor industry, but it also introduces more complexity in chip design, which translates to more intricate test requirements. The ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...

STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to ...

Semiconductor aging refers to the slow loss of electrical characteristics of the semiconductor device as a result of continuous use or prolonged exposure to various environmental conditions like ...

FREMONT, CA / ACCESSWIRE / July 16, 2024 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it entered into a stock purchase agreement ...

STAr Technologies, a leading supplier of semiconductor reliability test systems, today announces the sale of Accel-RF HTOL Burn-In test systems to top semiconductor foundries in Taiwan. Accel-RF ...

And the reason for this is because there is so much at stake.” Cars and planes need to be extremely reliable because people ...

ROHM signs strategic partnership with India’s Tata Electronics to develop and manufacture semiconductors in India.

FREMONT, CA / ACCESS Newswire / January 6, 2026 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in solutions, today announced that President and CEO Gayn ...

Now, it’s worth noting Stock Advisor’s total average return is 991 % — a market-crushing outperformance compared to 196% for ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...