Power reduction is one of the biggest challenges in CMOS integrated circuit design. Optimization of power is inevitable in order to reduce package cost and extended battery life. As a switch tri-modal ...
Power consumption has become a crucial concern in Built-In Self-Test (BIST) due to the switching activity in the Circuit Under-Test (CUT). In this paper, the authors present a novel method which aims ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results