Representing the building blocks of a complete PXI system, enabling better test capabilities, it leverages engineers’ access ...

Scalable test platform generates both legitimate and malicious traffic at multi-terabit, hyperscale volumes, realistically emulating DDoS attack mitigation of carrier-grade network loads Facilitates ...

The solution brings to offer testing capabilities tailored to the unique optical and physical properties of hollow core fiber ...

SAN FRANCISCO and NOIDA, India, Jan. 12, 2026 /CNW/ -- LambdaTest, the AI-native, agentic quality engineering platform, today announced its rebrand to TestMu AI, marking a bold step forward in its ...

TOKYO, Oct. 30, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the MTe power test platform. The cutting-edge MTe redefines ...

New liquid-cooling enabled system delivers affordable, high-density SLT and burn-in test for high-demand, lower-volume HPC, AI, and automotive devices TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading ...

TOKYO, Aug. 08, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today observed the 25th anniversary of its flagship V93000 system-on-chip (SoC) ...

The solution is designed to perform FAT testing on automation systems within a virtual environment before they’re deployed in the real world. Rockwell's Factory Test integrates NVIDIA's Omniverse APIs ...

During the fall of 2022, KEMA Labs in Chalfont, Pennsylvania, finished improvements to its test platform for surge arresters. The platform now meets the requirements outlined in IEEE C62.11, IEC 60099 ...

AresONE-M 800GE from Keysight performs Layer 1 through Layer 3 Ethernet testing at data center interconnect speeds from 10G to 800G. The test platform validates network equipment interoperability and ...

TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced its 7038 Single Test Rack (STR) system-level test (SLT) and ...